University of Strathclyde - Electron Microscopy Facility

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Our Microscopes


Electron probe microanalyser (EPMA)

Cameca SX100

This instrument is designed for the quantitative analysis of elemental composition using wavelength dispersive X-ray (WDX) spectroscopy. It has been also adapted to allow the acquisition of cathodoluminescence (CL) hyperspectral images in the visible region of the spectrum.

Dr Paul Edwards
0141 548 4369

Environmental scanning electron microscope

FEI Quanta 250 FEG-ESEM

This high-resolution SEM has low-vacuum and environmental capability, making it suitable for measuring non-conductive or hydrated samples. Additional detectors allow electron backscatter diffraction (EBSD), energy-dispersive X-ray (EDX) spectroscopy, cathodoluminescence (CL) and electron beam induced current (EBIC).

Dr Paul Edwards
0141 548 4369

JEOL scanning electron microscope

JEOL JSM-IT100

This general purpose SEM is fast and easy to use, with a resolution of down to 3 nm. It has low-vacuum capability, allowing non-conducting samples to be measured, and an energy dispersive X-ray (EDX) detector allows the identification and mapping of chemical elements.

Dr Paul Edwards
0141 548 4369

Scanning electron microscope

FEI Sirion 200 FEG-SEM

This is a high-resolution SEM used for general imaging of conductive or coated samples. It is also equipped with experimental detectors for structural characterisation using electron channelling contrast imaging (ECCI) and electron backscatter diffraction (EBSD).

Dr Paul Edwards
0141 548 4369