Tungsten low-vacuum SEM

JEOL, JSM-IT100 InTouchScope



Tunsten-source scanning electron microscope (SEM)

 

  • 3 nm spatial resolution
  • integrated EDX detector
  • low-vacuum capability for insulating samples
  • simple to use



Lab: TIC 122
Location: TIC
University of Strathclyde
Owner: Paul Edwards
Contact: Paul Edwards

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