Field-emission environmental SEM

FEI, Quanta 250 FEG-ESEM




Environmental (low vacuum) field emission scanning electron microscope (FEGSEM/ESEM)

  • Oxford Instruments 150 mm2 EDX silicon drift detector
  • Oxford Instruments electron backscatter diffraction (EBSD) detector
  • cathodoluminescence (CL) hyperspectral imaging
  • backscatter, forescatter and wet-STEM detectors
  • electron beam-induced current (EBIC)
  • nanoprobes with low current measurement capability
  • spring table for force measurements
  • liquid nitrogen cooled cryo stage

All users must read and sign the risk assessment for general laboratory risks.

 



Lab: TIC 112
Location:
Owner: Paul Edwards
Contact: Paul Edwards

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