Electron BackScatter Diffraction (EBSD)
Oxford Instruments, NordlysF+ 
Electron Backscatter Diffraction or EBSD is a scanning electron microscope based technique. Attached to our FE-SEM, the EBSD is used to analyse the crystallographic information about the microstructure of the sample.
This technique used for:
- Microstructure characterisation.
- Phase analysis; phase identification and quantification.
- Grain size measurement.
- Microtexture study
Lab: Advanced Materials Research Laboratory (AMRL) - Characterisation Laboratory
Location: James Weir Building
G1 1XJ
Owner: Advanced Materials Research Laboratory (AMRL)G1 1XJ
Contact: Advanced Materials Research Laboratory (AMRL)