Olympus GX51 inverted optical microscope



Purpose

Optical analysis of metallographic specimens. Capable of brightfield, darkfield, DIC, and simple polarization observations

Specifications

  • — General optical microscopy
  • — X1000 magnification
  • — AnalSIS software embedded
  • — Single lever switchover for brightfield/darkfield observation



Lab: AFRC - Materials capability
Location: AFRC
85 inchinnan drive
Owner: NMIS Enquiries

Further information

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