FEI/Oxford Instruments Quanta 250 FEG SEM

Purpose

Used for structural and chemical analysis of metallographic specimens. Magnification up to x1,000,000 and down to a
resolution of 3nm

Specifications

• — Scanning Electron Microscope (SEM) allows the observation microstructure in high magnification and superior resolution
• — Equipped with EBSD and EDX characterisation
• — Equipped with WDS/WDX
• — Electron Back-Scatter Diffraction (EBSD) for obtaining crystallographic information of materials
• — Energy-dispersive X-ray spectroscopy (EDS or EDX): analytical technique used for the elemental analysis or chemical characterization