Scanning Electron Microscope (W-SEM)

Analysis types: 

• Morphological and topographical imaging
• Surface fractography
• Materials microstructure
• Material composition by backscattered electron (BSE) imaging
• Elemental analysis and mapping using energy dispersive spectroscopy (EDS)
• Variable pressure mode for non-conductive specimens – i.e. not possible carbon/gold coating
• Non-destructive analysis on big components due to a large chamber (300mm x 110mm)
• In-situ micro-mechanical uniaxial tests with a 2kN load cell and video capture
• Environmental capability with the Cryostage and Quantomix cells, for analyses on beam sensitive materials or hydrated samples (e.g. biological materials, plants, food products, emulsions, concretes, suspensions, lubricants, etc.).