X-ray Diffractometer (XRD)

Bruker, D8 Advance




Suitable for metals and ceramics, at ambient and high temperatures (up to 2000°C). Specimens can be in bulk or powder form, thin films, corrosion products or debris.

Measured Properties:

  • Phase composition
  • Crystal structure
  • Lattice parameters & mismatches
  • Spatial orientation of crystals
  • Crystallinity
  • Residual stress
  • Grain texture
  • Layer thickness



Lab: Advanced Materials Research Laboratory (AMRL) - Characterisation Laboratory
Location: James Weir Building
G1 1XJ
Owner: Advanced Materials Research Laboratory (AMRL)
Contact: Advanced Materials Research Laboratory (AMRL)

Further information

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