Field Emission Scanning Electron Microscope (FE-SEM)

Hitachi, SU6600


Analysis Types:

  • Morphological and topographical imaging
  • Surface fractography
  • Materials microstructure
  • Grain size and texture analysis by electron backscattered diffraction (EBSD) 
  • Material composition by backscattered electron (BSE) imaging
  • Elemental analysis and mapping by means of energy dispersive spectroscopy (EDS)
  • Wavelength dispersive spectroscopy (WDS) for concentrations ≤500ppm or element overlaps (e.g. Mo/S)
  • Variable pressure mode for non-conductive specimens – i.e. when carbon/gold coating not possible
  • Scanning transmission electron microscopy (STEM) on thin films



Lab: Advanced Materials Research Laboratory (AMRL) - Characterisation Laboratory
Location: James Weir Building
G1 1XJ
Owner: Advanced Materials Research Laboratory (AMRL)
Contact: Advanced Materials Research Laboratory (AMRL)

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