Transmission Electron Microscope

he JEM-2011 is a conventional TEM with a lanthanum hexaboride electron source. It is used for imaging, electron diffraction and microanalysis of materials. Images can be recorded with a Gatan Multiscan CCD camera fitted below the column or a film camera. The JEM-2011 is equipped with an Oxford ISIS EDX system for compositional analysis.

Specifications:

Resolution: 0.18nm 
Probe Current: 10^-12-10^-6 A
Accelerating Voltage: 200 kV
Specimen Size: 3 mm
Detectors: CCD, Film, EDX
X-Tilt: ±18°.

More information is available from the St Andrews Electron Microscope Facility website.