Scanning Electron Microscope

Jeol , JSM-6700F

The JSM-6700F is a high resolution SEM with a field emission gun (FEG) electron source. It is equipped with a secondary electron detector for topographic contrast imaging, a retractable backscattered electron detector for atomic number contrast imaging and an Oxford Inca EDX system for compositional analysis.

Specifications:

Resolution: 3.5nm 
Probe Current: 10-12-10-6 A
Accelerating Voltage: 0.5-30 kV
Specimen Size: 125 mm
Detectors: SE, EDX

More details are available from the St Andrews Electron Microscope Facility website.

 



Lab: St Andrews Electron Microscopy Facility
Location: School of Chemistry
KY16 9ST
Owner: Ross Blackley

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