ToF-SIMS

About this technique

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a powerful tool for investigating the elemental and molecular distribution across surfaces and below surface layers. It uses a primary ion beam to bombard the sample, generating secondary ions from the surface which can form a mass spectrum. Scanning the primary ion beam across the surface creates a series of mass spectra that can be used to form an image of ion distribution. An additional ion beam can be used to remove the outermost layers from the sample, exposing new areas for analysis and providing chemical information from the sub-surface layers.

About this instrument

IONTOF TOF.SIMS 5

The TOF.SIMS 5 is the latest generation of high-end TOF-SIMS instruments developed over the last 25 years. Its design guarantees optimum performance in all fields of SIMS applications. The flexible, high precision sample manipulator as well as the perfect charge compensation allow the analysis of virtually all kinds of samples, making the TOF.SIMS 5 the most flexible SIMS tool in the market.